7:00AM- 8:00AM Registration
Time |
Topic and Speaker
|
Speaker |
| 8:00-8:15 AM | Welcome and Introduction | Lem Hollins |
8:15-9:10 AM | Effects of Static charge |
Arnie Steinman |
9:15-10:00 AM |
Physics of charging | Ian Morgan |
10:00-10:30 AM | Coffee Break |
|
10:30-11:15 AM | Damage Models | Leo G Henry |
10:15 AM-12:15
PM | Your Charge Control Program Measuring Resistance and Resisitivity |
Gene Johnson |
| 12:15-1:15
PM |
Hosted Lunch | |
1:15-2:00
PM | Auditing Your Facility | Mark Hogsett |
2:00-2:45
PM |
Methodology of EMI measurements | Vladimir Kraz |
2:45-3:30
PM | ESD Control in extreme sensitivity applications | Al Wallash |
3:30-4:00
PM | Coffee Break |
|
4:00-4:45
PM | Ionizers in Process Tools Design In, Adjusting and Periodic Verification | Rick Anzaldua |
4:45-5:00
PM |
Concluding Remarks | Steve Heymann |
5:00 - 5:30 PM |
Panel Session and Questions |
|
